Search results for "Optical probing"
showing 2 items of 2 documents
Optical Probing (EOFM/TRI): A large set of complementary applications for ultimate VLSI
2013
International audience; Electro Optical Techniques (EOFM: Electro Optical Frequency Mapping and EOP: Electro Optical Probing) and Dynamic Light Emission Techniques (TRE: Time Resolved Emission and TRI: Time Resolved Imaging) are dynamic optical probing techniques widely used at IC level for design debug and defect localization purpose. They can pinpoint the origin of timing issue or logic fault in up to date CMOS devices. Each technique has its advantages and its drawbacks allowing a common set of applications and more specific ones. We have been involved in the development of the most advanced techniques related to EOFM and TRI on various devices (down to 28nm technology). What we can expe…
Experimental Quantum Probing Measurements With No Knowledge on the System-Probe Interaction
2020
In any natural science, measurements are the essential link between theory and observable reality. Is it possible to obtain accurate and relevant information via measurement whose action on the probed system is unknown? In other words, can one be convinced to know something about the nature without knowing in detail how the information was obtained? In this paper, we show that the answer is surprisingly, yes. We construct and experimentally implement a quantum optical probing measurement where measurements on the probes, the photons' polarization states, are used to extract information on the systems, the frequency spectra of the same photons. Unlike the pre-existing probing protocols, our …